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  4. THESES-Elec. Engg.
Please use this identifier to cite or link to this item: http://localhost:8080/xmlui/handle/123456789/2403
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dc.contributor.authorPatel, Jashavant J.-
dc.date.accessioned2022-11-04T17:34:29Z-
dc.date.available2022-11-04T17:34:29Z-
dc.date.issued2016-01-
dc.identifier.urihttp://localhost:8080/xmlui/handle/123456789/2403-
dc.publisherThe Maharaja Sayajirao University of Barodaen_US
dc.subjectPhenomenaen_US
dc.subjectBiasen_US
dc.subjectVoltagesen_US
dc.subjectElectrical Engineeringen_US
dc.titleBreakdown phenomena and evaluation of testing methods under bias voltagesen_US
dc.typeThesisen_US
Appears in Collections:THESES-Elec. Engg.

Files in This Item:
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01_Title.pdf17.47 kBAdobe PDFView/Open
02_Dedication.pdf3.6 kBAdobe PDFView/Open
03_Certificate.pdf16.67 kBAdobe PDFView/Open
04_Abstract.pdf164.33 kBAdobe PDFView/Open
05_Content.pdf195.34 kBAdobe PDFView/Open
06_List of tables.pdf35.87 kBAdobe PDFView/Open
07_List of figures.pdf275.32 kBAdobe PDFView/Open
08_Nomenclature.pdf82.04 kBAdobe PDFView/Open
09_Chapter 1.pdf901.35 kBAdobe PDFView/Open
10_Chapter 2.pdf1.8 MBAdobe PDFView/Open
11_Chapter 3.pdf3.76 MBAdobe PDFView/Open
12_Chapter 4.pdf1.49 MBAdobe PDFView/Open
13_Chapter 5.pdf2.16 MBAdobe PDFView/Open
14_Chapter 6.pdf1.57 MBAdobe PDFView/Open
15_Chapter 7.pdf430.55 kBAdobe PDFView/Open
16_References.pdf689.32 kBAdobe PDFView/Open
17_Appendix I.pdf38.61 kBAdobe PDFView/Open
18_Acknowledgement.pdf30.41 kBAdobe PDFView/Open
19_Resume.pdf41.06 kBAdobe PDFView/Open
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